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In-situ Electron Microscopy

Autor
Herausgegeben von Gerhard Dehm, Herausgegeben von James M. Howe, Herausgegeben von Josef Zweck

In-situ Electron Microscopy

Untertitel
Applications in Physics, Chemistry and Materials Science
Beschreibung

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference coversreal-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing informationon the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Verlag
Wiley-VCH
ISBN/EAN
978-3-527-65218-1
Preis
151,99 EUR
Status
lieferbar